2. Short-circuit current breaking phenomena
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  • Current injections to various circuit elements P-Nos corresponds to case Nos in Table 2.1
    ATP Data Source

  • Line fault breaking (F3 in Fig. 2.3)
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  • Line fault breaking (F2 in Fig. 2.3 with "X"---ITRV)
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  • This page is based on Prof. E.Haginomori's lectures in Tokyo Institute of Technology, and edited by Japanese ATP User Group. Copyright (C) Eiichi Haginomori and Japanese ATP User Group.